Environmental Atomic Force Microscope

Information

Öppet förfarande
2018-05-12 09:40 (GMT+02:00)
2018-06-18 14:00

Inköpare

Norges Teknisk Naturvitenskapelige universitet (NTNU), Innkjøp Norges Teknisk Naturvitenskapelige universitet (NTNU), Innkjøp
Torill Slagstad
Seksjon for Anskaffelser
7491 Trondheim
Norge
974 767 880

Anbudsfristen har passerat.

Kort beskrivning

We plan to procure a state-of-the art SPM instrument, including software and drivers. The system will be used to study the electronic nanoscale properties of functional oxides at high temperatures in a controlled atmosphere. In addition to the nanoscale resolution of topographic properties in AFM modus, the instrument will provide the possibility of mapping a broad spectrum of electronic properties with the use of advanced technics such as for example cAFM, PFM, MFM, KPFM, and EFM amongst others (see appendix 1 for details). The research that shall be performed requires the experiments are carried out at a temperature of ≳ 280 degrees Celsius, while the atmospheric pressure and composition (for example argon, oxygen or nitrogen) is measured and controlled with high precision.

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