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We plan to procure a state-of-the art SPM instrument, including software and drivers. The system will be used to study the electronic nanoscale properties of functional oxides at high temperatures in a controlled atmosphere. In addition to the nanoscale resolution of topographic properties in AFM modus, the instrument will provide the possibility of mapping a broad spectrum of electronic properties with the use of advanced technics such as for example cAFM, PFM, MFM, KPFM, and EFM amongst others (see appendix 1 for details). The research that shall be performed requires the experiments are carried out at a temperature of ≳ 280 degrees Celsius, while the atmospheric pressure and composition (for example argon, oxygen or nitrogen) is measured and controlled with high precision.