Focused Ion Beam Scanning Electron Microscope (FIB-SEM) for Biological Specimens

Информация о тендерe

02 - Contract notice
Open procedure
11.11.2020 16:52 (GMT+01:00)
07.12.2020 13:00 (GMT+01:00)

Информация о покупателе

University of Helsinki University of Helsinki
Toni Wolanen Toni Wolanen
PL 4 (yliopistonkatu 3), Helsingin yliopisto
00014 Helsinki
Финляндия
0313471-7
www.helsinki.fi

Closing date has passed.

Информация о тендере

A high resolution field emission scanning electron microscope (SEM) equipped with a focused ion beam (FIB) for serial block face and section imaging of plastic embedded biological specimens.

Закупочная документация

Название Объем
Focused Ion Beam Scanning Electron Microscope (FIB-SEM) for Biological Specimens_liitteet.zip 314 KB
Focused Ion Beam Scanning Electron Microscope (FIB-SEM) for Biological Specimens.pdf 177 KB

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