Scanning Electron Microscope with Cathodoluminescence characterization capabilities

Hanke lühikirjeldus

The purpose of this tender is to enter an agreement relating to the purchase of a SEM and CL microscope for research purposes at SDU. The purpose of the SEM-CL apparatus is:
(1) to investigate electron-induced radiative decay in nanomaterials and nanostructures and
(2) to record high resolution micrographs of nanostructured specimen and device constituents.