GD MS.

Hange

Avatud menetlus
15.04.2016 10:32 (GMT+03:00)
11.05.2016 12:00
10.05.2016 23:59

Hankija

NTNU (The Norwegian University of Science and Technology) NTNU (The Norwegian University of Science and Technology)
Terje Haarberg
Jonsvannsveien 82
7050 Trondheim
Norra

Hange on lõppenud

Hanke lühikirjeldus

We wish to use the equipment/instrument to carry out quantitative chemical analyses of different materials. Our aim is primarily ‘solid state’ samples and the chemical analysis should give the levels a broad spectrum of elements present both as main impurities and trace elements. We have experience in using GDMS for trace element analyses in silicon for solar cells, and we wish to explore the possibilities of analysing other types of materials, both conductive and not conductive.

The procurement is not exclusively limited to the GDMS techniques, but it is important that the equipment makes it possible to carry out both qualitative and quantitative analyses of (but not exclusively):

— bulk chemical concentration( and if possible depth profile concentration) or impurities in semi-conductor silicon for photovoltaic cell applications;

— bulk chemical concentration (and if possible the depth profile concentration) of impurities in Aluminium and other metallic alloys;

— bulk chemical concentration (and if possible the depth profile concentration) of impurities in non-conductive materials, such as Si02 and Si3N4.

Important.

With regard to our requirement 25 (see Annex 1), the tenderer must contact the purchaser via the internet portal in sufficient time for the purchaser to send the described materials for testing. The test results will be a part of the evaluation.

For further requirements of the objective, please see the technical specification in annex 1 (see annex).

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