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The Center of Microscopy and Nanotechnology (CMNT) of the University of Oulu (hereafter called the Buyer) invites Tenders for a broad ion beam milling system for scanning electron microscope (SEM) specimen preparation. The system must be suitable for high-quality surface polishing and cross-section preparation from hard and soft materials for SEM imaging and analysis. Detailed requirements for the system are given in “APPENDIX 2, Mandatory Requirements for the System” and “APPENDIX 3, Evaluation of the Broad Ion Beam Milling System” attached to this call for tenders.
NOTE! Additional information on the notice is in the Tarjouspalvelu.fi supplier portal. Tenders/applications for participation are also sent using this system. You will find a direct link to additional information on the notice from this Hilma notice. |