Focused Ion Beam Scanning Electron Microscope (FIB-SEM) for Biological Specimens

Information

Tender type

03 - Contract award notice

Procedure

Open procedure

Publication date

3/2/2021 9:22 AM (GMT+01:00)

Buyer

Name

University of Helsinki

Department

Contact

Toni Wolanen

Address

PL 4 (yliopistonkatu 3)
00014 Helsinki
Finland

Org. number

0313471-7

Website

www.helsinki.fi

Assignment text

A high resolution field emission scanning electron microscope (SEM) equipped with a focused ion beam (FIB) for serial block face and section imaging of plastic embedded biological specimens.

Mercell Holding AS

Part of the Mercell Group, one of Europe’s leading providers of e tender systems and information between buyers and suppliers in the professional market.

Our products

Tender offer
ESPD
Tender consulting
E-tendering system
Blog

About us

The company
Investor
Departments
Mercell's Code of Conduct
Offer for EU-Supply Plc
Tender terminology
Career

Contact us

Write to us

+47 21 01 88 00