Sample nanomanipulator for a FEI Helios 600 focussed ion beam system

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Aalto University School of Electrical Engineering, Micronova Nanofabrication Centre (“Aalto Nanofab”) seeks a complete turn-key, stand-alone sample nanomanipulator system for a FEI Helios 600 Focused Ion Beam (“FIB”) system located in a cleanroom. The nanomanipulator will be used for manipulation of samples in the FIB, mainly for preparation of TEM-lamellas from samples of various sizes, shapes and materials. The FIB and the nanomanipulator will be used in a multi-user environment and thus the nanomanipulator must be easy to use and reliable, and necessary regular maintenance (for example tip change) must be doable in a minimum time without disturbing the processing capabilities for extended periods. For further information, see separate documents (as attachment files at the Hanki / Tarjouspalvelu Service at https://www.hanki-palvelu.fi/en/).