Atomic Force Microscope (AFM)

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Tampere University Foundation sr (Tampere University) executed a direct procurement of an atomic force microscope (AFM) for applications such as (but not limited to): (i) study of surface topography and mechanical modulus of light-and heat-sensitive thin films under photoirradiation and at different temperatures; (ii) imaging of live cells and mechanical mapping of extremely soft hydrogels; (iii) study of electronic properties (e.g. work function) and their degradation (e.g. under light irradiation) of organic and inorganic semiconducting materials. The system is installed in the Tampere Microscopy Center which has a broad user base barring the acquisition of prototype systems.