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A complete turnkey, stand-alone photoluminescence measurement system, capable of producing high-resolution photoluminescence images and photoluminescence signal based calibrated lifetime maps of semiconductor samples with varying dimensions. The system needs to be capable of providing both photoluminescence and lifetime measurements at varying excitation light intensities. The main material of interest is silicon. Thus, the configuration of the system has to be capable of band-to-band excitation of charge carriers in silicon and detecting the band-to-band photoluminescence signal in silicon.