Metrology system for characterisation of quantum materials

Information

03 - Meddelande om tilldelning av kontrakt
Öppet förfarande
2022-06-15 09:28 (GMT+02:00)

Inköpare

Kungliga Tekniska högskolan Kungliga Tekniska högskolan
Karin Edoff Karin Edoff
Drottning Kristinas väg 6
11428 Stockholm
Sverige
202100-3054

Tilldelningsinformation

Purpose of procurement KTH is seeking tenders for a metrology platform equipped with electrical, optical, magnetic, thermal, and mechanical measurement capabilities, designed for variable temperature and magnetic fields (q-sensor/comms/computing devices are used primarily at low-T). Such a platform will offer quick-turnaround test and characterisation, thereby significantly shortening our fabrication loops and process iteration times. As most optical properties are well characterised using ellipsometry techniques at zero magnetic field and room temperature, it is acceptable if the optical measurements are performed in a separate system where collected data can be fed forward into further measurements in the main tool.

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