X-ray Diffraction System

Hange

Avatud menetlus
08.05.2024 20:57 (GMT+03:00)
03.11.2023 0:59 (GMT+02:00)

Hankija

Linköpings Universitet Linköpings Universitet
Jessica Kindqvist Jessica Kindqvist
Upphandlingsenheten
58183 Linköping
Rootsi
202100-3096

Hange on lõppenud

Hanke lühikirjeldus

An X-ray diffraction (XRD) system for characterization of thin films and nanostructured materials is to be procured by the Department of Physics, Chemistry, and Biology (IFM) at Linköping university (LiU). IFM is the leading materials science environment in Sweden and has successfully incorporated XRD in the research for many years.

Scope and objective

An X-ray diffraction (XRD) system for characterization of thin films and nanostructured materials is to be procured by the Department of Physics, Chemistry, and Biology (IFM) at Linköping university (LiU). IFM is the leading materials science environment in Sweden and has successfully incorporated XRD in the research for many years.

The Thin Film Physics Division at Linköping University is a renowned research group specializing in the field of thin film physics. With expertise in materials science, surface physics, nanotechnology, and condensed matter physics, the division conducts cutting-edge research in various aspects of thin films. The work encompasses fundamental investigations into the properties and behaviors of thin films, as well as their practical applications in fields such as tribology, electronics, energy, optics, and sensors.

A more detailed description of the procurement object and the requirements is presented in chapter 2, 3 and 4.

The purchase will hereinafter be called System. Tenderers must submit a tender including all aspects of specified requirements.

A contract will be signed with one (1) supplier.

Hankele lisatud dokumendid

Dokumendi nimi Faili suurus
Appendix 1 Declaration of Truth.pdf 142 KB
Appendix 2 ALOS O5E.pdf 40 KB
Questions and answers.pdf 39 KB
Information about the procurement.pdf 253 KB
Introduction - General.pdf 190 KB
Alternative 1 - Two diffractometer system.pdf 396 KB
Alternative 2 - One diffraction system.pdf 391 KB
Contractual terms.pdf 284 KB
Qualification.pdf 447 KB
Appendix 1 Procurement protocol.pdf 136 KB
Award decision X-ray Diffractometer-signed.pdf 217 KB

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