The main use of the instrument will be imaging along with chemical analysis (however, the chemical analysis is in the tender document entering as an option) of various materials:
— Ranging from isolators, semiconductors to metals
— Small nm-sized particles; magnetic or non-magnetic in nature
— Materials that release organic residues or humidity under the electron beam/vacuum
Typical applications for the instrument will be:
— Imaging of particles (may be magnetic) for size distribution analysis down to some few nm (3-4?), morphology, and chemical analysis
— Evaluation of particles in the range 10-50 nm with a 2-10 nm coating. Chemical composition as well as investigation of coating thickness
— Characterization of thin films (typically 100 nm) deposited onto different substrates (typically Si). Imaging for characterization of film topography as an alternative to AFM, including images of cross-section of broken film substrate. For the latter application, solid contrast between the substrate and the film is crucial
— Imagining of pore structure (< 5-10 nm) of porous insulating materials
For all applications the chemical analysis (EDS) shall at this point be considered as an option.
Section V: Award of contract
Contract No: 1
Lot No: 1 - Lot title: Scanning Electron Microscope
V.1) Date of contract award decision:
10.2.2014
V.2) Information about offers
Number of offers received: 4
V.3) Name and address of economic operator in favour of whom the contract award decision has been taken
SE- Spectral Solutions AB, Bredablikkvägen 7, 181 42 Lidingø, SWEDEN