Short description
NGU is seeking through this negotiated procedure for a supplier for a Scanning Electron Microscope (SEM) instrument and accessories, as described in Appendix 1_2, along with goods and services needed for supply and delivery, installation and calibration, software, maintenance and disposal of after-sale services.
The SEM instrument is to be used for the identification and characterization (hereunder spatial distribution) of minerals and related materials by SE, BSE, EDS and hyperspectral cathodoluminescence CL and/or morphological imaging of sub-nm scale features. All these detectors shall be included.
The SEM instrument shall be able to accommodate additional super-high resolution WDS and uXRF detectors to be purchased later.
The SEM instrument shall be able to load via air lock default standard-sized ~28×48mm petrographic thin sections and/or polished blocks ø30×10mm (plastiline-mounted on a standard petrographic carrier glass).