Hankintapäätös
The purchase concerns AFM tips for nano FTIR microscopy (neaSNOM). These tips were specially developed for scattering type scanning near field optical microscopy (sSNOM) by the manufacturer of our instrument because of deficiencies of other tips available on the market. They provide a higher signal to noise ratio (around 5 times) in the infrared spectra recorded with our neaSNOM instrument.