Helios 5 UC with secondary ion mass spectrometer

Norite gauti panašią informaciją kas rytą? Registruokitės 7 dienų NEMOKAMAI Mercell versijai!

Helios 5 UC with secondary ion mass spectrometer

The proposed product represents a significant advancement in scientific instrumentation, combining cutting-edge technologies to enable precise material characterization. The key features and specifications (please see PDF "Extended information") that make this product uniquely suited for our specific needs within the Danish national infrastructure cluster “NANOCHEM” are outlined.

The product seamlessly integrates several critical functionalities, including advanced scanning-electron microscopy (SEM), focused ion beam (FIB) nanofabrication, sample preparation for transmission electron microscopy (TEM), energy dispersive spectroscopy (EDS), and secondary ion mass spectrometer (SIMS). These capabilities allow for rapid and accurate material analysis at the nanometer scale.


Based on the market research SDU approached  Thermoscientific, FEI Europe BV.
Branch Denmark, as the only known commercial supplier with the required specifications.