SEM/FIB metrology platform

Information

03 - Contract award notice
Offenes Verfahren
10.02.2023 09:49 (GMT+01:00)

Buyer

Kungliga Tekniska högskolan Kungliga Tekniska högskolan
Karin Edoff Karin Edoff
Drottning Kristinas väg 6
11428 Stockholm
Schweden
202100-3054

Assignment text

Purpose of procurement KTH is seeking tenders for a SEM/FIB metrology platform. The purpose of the procurement is to acquire a platform for imaging and patterning of novel materials and devices at the nanoscale.

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