Focused Ion Beam Scanning Electron Microscope (FIB-SEM) for Biological Specimens

Information

02 - Contract notice
Open procedure
11/11/2020 4:52 PM (GMT+01:00)
12/7/2020 1:00 PM (GMT+01:00)

Buyer

University of Helsinki University of Helsinki
Toni Wolanen Toni Wolanen
PL 4 (yliopistonkatu 3), Helsingin yliopisto
00014 Helsinki
Finland
0313471-7

Closing date has passed.

Short description

A high resolution field emission scanning electron microscope (SEM) equipped with a focused ion beam (FIB) for serial block face and section imaging of plastic embedded biological specimens.

Files (click "Show interest" to get access)

Name Size
Focused Ion Beam Scanning Electron Microscope (FIB-SEM) for Biological Specimens_liitteet.zip 314 KB
Focused Ion Beam Scanning Electron Microscope (FIB-SEM) for Biological Specimens.pdf 177 KB

Mercell Holding AS

Part of the Mercell Group, one of Europe’s leading providers of e tender systems and information between buyers and suppliers in the professional market.

Contact us

Write to us

+47 21 01 88 00